幾種常用芯片檢測(cè)的設(shè)計(jì)與實(shí)現(xiàn)

摘 要

芯片作為計(jì)算機(jī)基本輸入輸出的程序、系統(tǒng)設(shè)置信息、開(kāi)機(jī)上電自檢程序和系統(tǒng)啟動(dòng)自舉程序的工具，為計(jì)算機(jī)提供最底層的、最直接的硬件設(shè)置和控制。為確保安全性和穩(wěn)定性，避免不必要的損失，其檢測(cè)就顯得尤為重要。本文介紹了常用芯片檢測(cè)系統(tǒng)的一種設(shè)計(jì)方案，其基本原理是通過(guò)數(shù)據(jù)比較來(lái)確定芯片的好壞。本系統(tǒng)通過(guò)對(duì)時(shí)間頻率的測(cè)量，確定定時(shí)計(jì)數(shù)器的好與否；通過(guò)給標(biāo)準(zhǔn)8255送入數(shù)據(jù)，再將標(biāo)準(zhǔn)8255輸出的數(shù)據(jù)送給待測(cè)芯片，經(jīng)數(shù)據(jù)比較判斷常用芯片好壞；通過(guò)對(duì)8255輸入數(shù)據(jù)，對(duì)244和374進(jìn)行判斷；通過(guò)ADC0809來(lái)測(cè)量標(biāo)準(zhǔn)電壓，并測(cè)量0832輸出的標(biāo)準(zhǔn)電壓來(lái)檢測(cè)AD和DA模塊。操作時(shí)，將待測(cè)芯片對(duì)應(yīng)鍵按下，經(jīng)過(guò)系統(tǒng)測(cè)試后，以數(shù)碼管來(lái)顯示芯片是否能夠正常工作。其優(yōu)點(diǎn)是簡(jiǎn)單實(shí)用、操作方便、經(jīng)濟(jì)效益，可以迅速的檢測(cè)出芯片的工作是否正常。文中闡述了設(shè)計(jì)思路，同時(shí)也給出了相應(yīng)的原理圖和流程圖。

關(guān)鍵詞：檢測(cè);芯片;數(shù)據(jù)比較;測(cè)量

Abstract

Chip as a tool of the computer's basic input-output procedures, system setup information, Power on Self Test on the boot process and system bootstrap program to start, to provide the bottom, the most direct control and the hardware settings of the computer. To ensure the security and stability, to avoid unnecessary losses and its detection seem particularly important. In this dissertation, I have introduced a design of common chip detection system and its basic principle is that the quality of chips can be determined through the data comparison. The system define timing counter whether good or not by time-frequency measurements; by sending data to the normal 8255, then transferring the output datum to the chip needing check, judge common chip whether good or not by data comparison; judge 244 and 374 according to input the data to 8255; measure the standard voltage that come through ADC0809, and detect the AD and DA modules by measuring the standard of 0832 output voltage. While operating, press the corresponding button of the chip which waiting for measurement, after the system measurement, Chip can work properly or not will be showed by Digital tube. The advantage is simple and practical, easy to operate, cost-effective, can be quickly detected the normal work of the chip. The paper described the design ideas, as well as the corresponding schematic diagram and flow chart.

Keywords: detection; chip; data comparison; measurement

目 錄

0  前言……………………………………………………………………………1
1  AT89C51單片機(jī)的功能簡(jiǎn)要介紹…………………………………………2
1.1AT89C51簡(jiǎn)介…………………………………………………………………2
1.2  AT89C51的的引腳功能…………………………………………………2
1.3  AT89C51的定時(shí)/計(jì)數(shù)器…………………………………………………3
1.4 串行通信……………………………………………………………………5
2  74LS138譯碼器的簡(jiǎn)要介……………………………………………………7
2.1  74LS138工作原理………………………………………………………7
2.2  74LS138引腳功能……………………………………………………7
2.3  74LS138譯碼器真值表…………………………………………………7
3  地址鎖存器74LS373的簡(jiǎn)要介紹…………………………………9
3.1  74LS373工作原理………………………………………………………9
3.2  74LS373引腳說(shuō)明……………………………………………………9
3.3  74LS373內(nèi)部結(jié)構(gòu)……………………………………………………9
3.4  74LS373的優(yōu)點(diǎn)……………………………………………………10
4  芯片8255的檢測(cè)…………………………………………………………11
4.1  內(nèi)部結(jié)構(gòu)和引腳功能…………………………………………………11
4.2  8255控制字和狀態(tài)字……………………………………………………13
4.3  芯片8255的檢測(cè)方法…………………………………………………14
4.4  芯片8255的電路原理圖………………………………………………14
4.5  芯片8255的測(cè)程序流程圖……………………………………………15
4.6  芯片8255的檢測(cè)程序…………………………………………………16
5  芯片74ls244的檢測(cè)…………………………………………………17
5.1  74LS244特性………………………………………………………17
5.2  74LS244的檢測(cè)方法……………………………………………17
5.3  74LS244的檢測(cè)電路圖………………………………………………17
5.4  74LS244的檢測(cè)程序流程圖………………………………18
5.5  74LS244的檢測(cè)程序………………………………………………18
6  芯片74LS374的檢測(cè)的檢測(cè)……………………………………………20
6.1  74LS374的特性……………………………………………………20
6.2  74LS374的檢測(cè)方法………………………………………………20
6.3  74LS374的檢測(cè)電路圖…………………………………………20
6.4  74LS374的檢測(cè)流程圖…………………………………………………21
6.5  74LS374的檢測(cè)程序……………………………………………22
7  芯片ADC0809的檢測(cè)…………………………………………………24
7.1  ADC0809內(nèi)部結(jié)構(gòu)……………………………………………………24
7.2  0809的檢測(cè)方法………………………………………………………25
7.3  0809的檢測(cè)電路圖………………………………………………………25
7.4  0809的檢測(cè)程序流程圖…………………………………………………26
7.5  0809的檢測(cè)程序……………………………………………………26
8  芯片0832的檢測(cè)……………………………………………………29
8.1  0832的內(nèi)部特性……………………………………………………29
8.2  0832的檢測(cè)方法……………………………………………………30
8.3  0832的檢測(cè)電路原理圖…………………………………………………31
8.4  0832的檢測(cè)流程圖……………………………………………………31
8.5  0832的檢測(cè)程序……………………………………………………32
9  芯片8253的檢測(cè)……………………………………………………35
9.1  8253基本結(jié)構(gòu)和功能……………………………………………………35
9.2  8253的編程說(shuō)明……………………………………………………36
9.3  8253的檢測(cè)方法……………………………………………………38
9.4  8253的檢測(cè)電路原理圖…………………………………………………38
9.5  8253的檢測(cè)程序流程圖…………………………………………………39
9.6  8253的檢測(cè)程序…………………………………………………39
10  技術(shù)經(jīng)濟(jì)分析………………………………………………………………42
11  結(jié)論…………………………………………………………………………43
致謝…………………………………………………………………………44
參考文獻(xiàn)…………………………………………………………………………45
附錄A譯文…………………………………………………………46
附錄B 外文文獻(xiàn)……………………………………………………………57