單片機廣泛應用于商業(yè)：諸如調制解調器，電動機控制系統(tǒng)，空調控制系統(tǒng)，汽車發(fā)動機和其他一些領域。這些單片機的高速處理速度和增強型外圍設備集合使得它們適合于這種高速事件應用場合。然而，這些關鍵應用領域也要求這些單片機高度可靠。健壯的測試環(huán)境和用于驗證這些無論在元部件層次還是系統(tǒng)級別的單片機的合適的工具環(huán)境保證了高可靠性和低市場風險。Intel 平臺工程部門開發(fā)了一種面向對象的用于驗證它的AT89C51 汽車單片機多線性測試環(huán)境。這種環(huán)境的目標不僅是為AT89C51 汽車單片機提供一種健壯測試環(huán)境，而且開發(fā)一種能夠容易擴展并重復用來驗證其他幾種將來的單片機。開發(fā)的這種環(huán)境連接了AT89C51。本文討論了這種測試環(huán)境的設計和原理，它的和各種硬件、軟件環(huán)境部件的交互性，以及如何使用AT89C51。


Microcontrollers are used in a multitude of commercial applications such as modems, motor-control systems, air conditioner control systems, automotive engine and among others. The high processing speed and enhanced peripheral set of these microcontrollers make them suitable for such high-speed event-based applications. However, these critical application domains also require that these microcontrollers are highly reliable. The high reliability and low market risks can be ensured by a robust testing process and a proper tools environment for the validation of these microcontrollers both at the component and at the system level. Intel Plaform Engineering department developed an object-oriented multi-threaded test environment for the validation of its AT89C51 automotive microcontrollers. The goals of thisenvironment was not only to provide a robust testing environment for the AT89C51 automotive microcontrollers, but to develop an environment which can be easily extended and reused for the validation of several other future microcontrollers. The environment was developed in conjunction with Microsoft Foundation Classes (AT89C51). The paper describes the design and mechanism of this test environment,