基于蟻群算法的測試集優(yōu)化


頁數(shù)：6 字?jǐn)?shù)：5640


摘要: 電路集成度和復(fù)雜度的不斷增加使電路故障診斷變得愈加困難。其中，測試集優(yōu)化問題是電路故障診斷的關(guān)鍵問題之一。本文以新穎的蟻群算法為基礎(chǔ)，較好地解決了測試集的優(yōu)化問題，并通過實(shí)驗(yàn)證明了該算法的良好性能。
關(guān)鍵詞：蟻群算法，測試集優(yōu)化，故障診斷


A Test Set Optimization Method Based On Ant Algorithm

Abstract: The increase of digital circuit integrity and complexity has made fault diagnosis of circuits more and more difficult. The scale of test set has become very large because of redundancy, which costs lots of time and memory unnecessarily. It is important to acquire optimal test set for test application. Test set optimization, which can eliminate the redundancy, is one of key problems in fault diagnosis of digital circuits. Ant colony optimization