基于ds18b20分組式溫度測(cè)試系統(tǒng)設(shè)計(jì)_外文翻譯.doc
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基于ds18b20分組式溫度測(cè)試系統(tǒng)設(shè)計(jì)_外文翻譯,摘要當(dāng)用于多點(diǎn)測(cè)溫時(shí),所有的ds18b20傳感器都連接在單片機(jī)的某根總線上,采用輪流采集溫度數(shù)據(jù)的方式。當(dāng)系統(tǒng)有多個(gè)傳感器時(shí),單片機(jī)用于處理溫度數(shù)據(jù)的時(shí)間就會(huì)明顯延長(zhǎng),從而導(dǎo)致測(cè)溫系統(tǒng)周期增長(zhǎng)。在本文中,采取對(duì)ds18b20合理的分組的方法,并在軟件上采取一定措施,從而明顯的提高交替檢測(cè)速度。關(guān)鍵詞:ds18b20分組...
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此文檔由會(huì)員 莎士比亞 發(fā)布
摘要
當(dāng)用于多點(diǎn)測(cè)溫時(shí),所有的DS18B20傳感器都連接在單片機(jī)的某根總線上,采用輪流采集溫度數(shù)據(jù)的方式。當(dāng)系統(tǒng)有多個(gè)傳感器時(shí),單片機(jī)用于處理溫度數(shù)據(jù)的時(shí)間就會(huì)明顯延長(zhǎng),從而導(dǎo)致測(cè)溫系統(tǒng)周期增長(zhǎng)。在本文中,采取對(duì)DS18B20合理的分組的方法,并在軟件上采取一定措施,從而明顯的提高交替檢測(cè)速度。
關(guān)鍵詞:DS18B20分組 ;溫度測(cè)試;交替檢測(cè)時(shí)間
Abstract
All the DS18B20 sensors, used for the multipoint test temperature, are connected with MCU on one of IO bus, and temperature data are collected by turns. If the system has a large amount of sensors, the time of MCU used in processing the temperature data is obviously prolonged, so the cycle of alternate test gets longer. In this paper, a new method that DS18B20 are rationally grouped is presented, and some measures are taken in software; as a result, the speed of alternate test advances distinctly.
Key words- DS18B20 Group ,temperature test, time spent on the alternate test
當(dāng)用于多點(diǎn)測(cè)溫時(shí),所有的DS18B20傳感器都連接在單片機(jī)的某根總線上,采用輪流采集溫度數(shù)據(jù)的方式。當(dāng)系統(tǒng)有多個(gè)傳感器時(shí),單片機(jī)用于處理溫度數(shù)據(jù)的時(shí)間就會(huì)明顯延長(zhǎng),從而導(dǎo)致測(cè)溫系統(tǒng)周期增長(zhǎng)。在本文中,采取對(duì)DS18B20合理的分組的方法,并在軟件上采取一定措施,從而明顯的提高交替檢測(cè)速度。
關(guān)鍵詞:DS18B20分組 ;溫度測(cè)試;交替檢測(cè)時(shí)間
Abstract
All the DS18B20 sensors, used for the multipoint test temperature, are connected with MCU on one of IO bus, and temperature data are collected by turns. If the system has a large amount of sensors, the time of MCU used in processing the temperature data is obviously prolonged, so the cycle of alternate test gets longer. In this paper, a new method that DS18B20 are rationally grouped is presented, and some measures are taken in software; as a result, the speed of alternate test advances distinctly.
Key words- DS18B20 Group ,temperature test, time spent on the alternate test
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